The developed system works in an automatic mode and supports signal generation measurements up to 20GHz. The system provides accurate and repeatable m
The system is designed to measure the optical, electrical parameters, characteristics of the radiating sources, different displays, lighting panels an
SRAM Test System is a high performance, low cost memory test solution. The system delivers high efficiency for asynchronous Static RAM memory testing.
The system is designed to measure static and dynamic parameters of high-power MOSFET and IGBT transistors; measuring system self-test; measuring syste
The system is designed to measure DC parameters and detect failures of operational amplifiers, which enabled to monitor quality of the production.
The special feature and software have been designed and developed for measuring dynamic and static parameters of high-speed pipelined ADCs with 100 MH
The system is based on the NI PXI platform. It is designed for automated test of high-speed ADCs using sine-wave signals of different frequencies.
The system is designed for functional and parametric control of dynamic and static parameters of high-speed ADCs (up to 1 GHz).
The system is designed for testing and monitoring the parameters of electronic components (generators, low noise amplifiers, filters, attenuators, etc
Test system is designed to measure gyroscopes parameters, including measurements in the temperature range in order to control the quality of devices.