System for Testing High-Speed ADC
- Model: DF-RP-797
- Brand: ATES
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The special feature and software have been designed and developed for measuring dynamic and static parameters of high-speed pipelined ADCs with 100 MHz sampling rate and 300 MHz bandwidth.
The system is capable of measuring the following static and dynamic ADC parameters:
- High level voltage
- Low level voltage
- Offset error
A high-stable 1 GHz clock generator with programmable clock divider is installed to achieve high stable clock for sampling and low jitter. The clock source can be programmable selected from built-in 1GHz clock or NI PXI 6674 Timing Module. Special feature allows to measure the above mentioned parameters in wide range of temperature -60-80C.