Universal Test System for High-Speed ADCs

  • Model: DF-RP-796
  • Brand: ATES
Price to be announced

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The system is designed for automated test of high-speed ADCs using sine-wave signals of different frequencies. The uniqueness of the system is that the static and dynamic parameters are determined with a high accuracy. Another advantage is the ability to operate in a wide temperature range.

The system is based on the NI PXI platform and uses software developed in the NI LabVIEW graphical programming environment.


Dynamic parameters

  1. Spurious-free dynamic range (SFDR)
  2. Signal-to-noise and distortion ratio (SINAD)
  3. Total harmonic distortion (THD)
  4. Signal-to-noise ratio (SNR)
  5. Effective number of bits (ENOB)

Static parameters

  1. Full Scale Range (FSR)
  2. Integral nonlinearity (INL)
  3. Differential nonlinearity (DNL)
  4. I(d)
  5. t(DA)
  6. U(io)
  7. U(cml)
  8. U(refp)
  9. Aperture 

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