High-Speed ADCs Test System

  • Model: DF-RP-795
  • Brand: ATES
Price to be announced

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The system is designed for functional and parametric control of dynamic and static parameters of high-speed ADCs (up to 1 GHz). The test system is based on the NI PXI platform and uses software developed in the NI LabVIEW graphical programming environment.

The system is designed for industrial and investigation test. The system parameters can be configured according to the requirements.

Measurements

Static parameters

  1. Current consumption of the analog part of the ADC
  2. Current consumption of the digital part of the ADC
  3. Differential output voltage values
  4. Logical levels’ voltages of the synchronizing signal
  5. Input resistance
  6. Offset error
  7. Range of the complete scale
  8. Integral nonlinearity (INL)
  9. Differential nonlinearity (DNL)

Dynamic parameters

  1. Signal-to-noise ratio (SNR)
  2. Signal-to-noise and distortion ratio (SINAD)
  3. Spurious-free dynamic range (SFDR)
  4. Total harmonic distortion (THD)
  5. Second- and third-degree harmonic components
  6. Aperture jitter
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