Electronic device testers
Electronic device testers forvarious ICs (ADC, DAC, RAM, etc.)
The testers consist of data acquisition and processing modules along withmultiple probes for the testing of power parameters (voltage,current) for input and output signals.
Electromechanical device testers
A system for testing dynamically tunable gyroscopes. Measurement ofgyroscope parameters, including measurements in the temperaturerange, for products output control.
The test bench consists of a turntable, on which four gyroscopes can beinstalled, and a cabinet with a real-time controller, dataacquisition and processing modules, as well as gyroscope controlmodules. The cabinet is connected to the turntable using the CANinterface.
Incidental deviation speed
Parameters temperature dependence
Parameters specific for a particular gyroscope type.
Manual and automatic measurements
Data storage in a database
Simultaneous testing of up to four gyroscopes
Simple and convenient user interface