Analog chip testers
Analog chip testers formeasurement of static and dynamic parameters of operationalamplifiers, comparators, etc., with and heat chamber connectivityoption.
Voltage gain: from 1 to 5*103 V/mV
Voltage offset: from ± 1 µV to ± 10 mV
Input current: from ± 10 nA to ± 100 µA
Common mode rejection ratio: from 20 to 130 dB
Rate of rise of output voltage: up to 5000 V/µs
Digital chip testers
Digital chip testers forcomplex automated testing and incoming inspection of large and verylarge scale integration circuits and memory chips. The device can beused for testing of microprocessors, memory chips, ASICs, FPGAs, etc.The number of signal terminal connections can be varied depending onthe task.
Test memory: up to 64Mb
Operating frequency: up to 200MHz
Mixed type IC testers
Mixed type IC testers forparametric control of static and dynamic parameters of analog-digitaland digital-analog integrated circuits.
Tested IC’s digit capacity: up to 24 bit
Tested IC’s with sampling rate: up to 1GHz
Analog signal dynamic range: up to 118 dBFS
Support of TTL, LVTTL and LVDS standards