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High-Speed ADCs Test System

The system is designed for functional and parametric control of dynamic and static parameters of high-speed ADCs (up to 1GHz) and to performs functional control.

Specifications:

  • High-count LVDS channel simultaneous acquisition
  • High-count single-ended simultaneous acquisition and generation with per pin programmable voltage levels for VOH, VOL, VTT, VIH and VIL
  • Logical level registration of the digital lines

Measured Parameters:

Static parameters

  • Current consumption of the analog / digital part of the ADC
  • Differential output voltage values
  • Logical levels’ voltages of the synchronizing signal
  • Input resistance
  • Offset error
  • Range of the complete scale
  • Integral / Differential nonlinearity (INL / DNL)

Dynamic parameters

  • Signal-to-noise ratio (SNR)
  • Signal-to-noise and distortion ratio (SINAD)
  • Spurious-free dynamic range (SFDR)
  • Total harmonic distortion (THD)
  • Second- and third-degree harmonic components
  • Aperture jitter

Details :

  • Category : Semiconductor Test