Archive
Test Summit 2015
20/03/2015
This free-to-attend, one-day test industry conference offers engaging keynotes, technical training and case studies for attendees from a wide range of industries including RF and communications and industrial electronics.
Event: Test Summit 2015
Date: Wednesday, 22 April 2015
Location: Tallinn Science Park Tehnopol (Conference room SATURN), Teaduspargi 6/1, Tallinn, Estonia (Google Maps)
Event language: English
Participation is free of charge, but registration is required. Number of participants is limited up to 50.
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Agenda |
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9.00 - 9:20 |
Opening and Welcome Note |
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09:20 – 10:00 |
Semiconductor Testing Systems |
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- NI Semiconductor Test System(STS) |
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- Functional Test |
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- Characterization Test |
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- Testers For Research & Development Departments |
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- Production Test (End of Line Test), |
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10:00 – 10:20 |
Coffee/Tea Break |
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10:20 – 11:00 |
Test Systems for Original Equipment Manufacturers (OEM) |
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- Functional Test |
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- Characterization Test |
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- Quality Assurance (QA) |
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11:00 – 11:40 |
RF Components and RF Device Test Systems |
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- Functional Test For Research & Development Departments |
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- Quality Assurance (QA) |
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- Production Test (End of Line Test) |
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11:40 – 12:20 |
Wireless Communication and Mobile Device Test |
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12:30 – 13:30 |
Lunch |
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13:30 – 14:30 |
Discussion about Customers Applications and Problems How We can cooperate to solve them |
Last Day to Register: Sunday, 19 April, 2015 inclusive. Register Now
List of Presenters:
1. Hakob Arshakyan: Partner Manager, National Instruments
2. Hakob Gevorgyan:7-year experience in Radio Components Test and Electronic Device Functional/Parametric Test
3. David Zargaryan: 5-year experience in RF Device Test, PhD
4. Orbel Sevoyan: 8-years experience in RF Communications Test and Software Defined Radio Design and Test, PhD
Summit organizer: DIFI.NET LLC.
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The company is specialized in Automated Test Systems for the following Applications:
- Semiconductor Test
- Electronic Device Functional/Parametric Test (for OEM)
- RF Components and RF Device Test
- Wireless Communication and Mobile Device Test
All of the Testers are based on National Instruments Hardware and Software Platform
Download Test Summit Agenda in PDF [391kb]