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Test Summit 2015

20/03/2015

This free-to-attend, one-day test industry conference offers engaging keynotes, technical training and case studies for attendees from a wide range of industries including RF and communications and industrial electronics.

Event: Test Summit 2015

Date: Wednesday, 22 April 2015

Location: Tallinn Science Park Tehnopol (Conference room SATURN), Teaduspargi 6/1, Tallinn, Estonia (Google Maps)

Event language: English  

Participation is free of charge, but registration is required. Number of participants is limited up to 50.

Agenda

9.00 - 9:20

 Opening and Welcome Note

 

09:20 – 10:00

 Semiconductor Testing Systems

-          NI Semiconductor Test System(STS)

-          Functional Test

-          Characterization Test

-          Testers For Research & Development Departments

-          Production Test (End of Line Test),

10:00 – 10:20

 Coffee/Tea Break

10:20 – 11:00

 Test Systems for Original Equipment Manufacturers (OEM)

-          Functional Test

-          Characterization Test

-          Quality Assurance (QA)

11:00 – 11:40

 RF Components and RF Device Test Systems

-          Functional Test For Research & Development Departments

-          Quality Assurance (QA)

-          Production Test (End of Line Test)

11:40 – 12:20

 Wireless Communication and Mobile Device Test
               -          Mobile Base Station Test
               -          GSM/LTE/UMTS Repeater Test
               -          COSPAS/SARSAT Transmitter

12:30 – 13:30

 Lunch

 

13:30 – 14:30

Discussion about Customers Applications and Problems How We can cooperate to solve them



Last Day to Register: Sunday, 19 April, 2015 inclusive.    Register Now

List of Presenters:
1. Hakob Arshakyan: Partner Manager, National Instruments
2. Hakob Gevorgyan:7-year experience in Radio Components Test and Electronic Device Functional/Parametric Test
3. David Zargaryan: 5-year experience in RF Device Test, PhD
4. Orbel Sevoyan: 8-years experience in RF Communications Test and Software Defined Radio Design and Test, PhD

Summit organizer:  DIFI.NET LLC.

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The company is specialized in Automated Test Systems for the following Applications:
- Semiconductor Test
- Electronic Device Functional/Parametric Test (for OEM)
- RF Components and RF Device Test
- Wireless Communication and Mobile Device Test
All of the Testers are based on National Instruments Hardware and Software Platform

 

Download Test Summit Agenda in PDF [391kb]